Picture of Four Point Probe
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The four point probe has a manually operated substrate table and is equipped with a single probe layout, with 1.27 mm spacing between the probes, 0.48 mm probe diameter, and 60 g spring pressure. The system is capable of measuring sheet resistances between 100 mohm/sq. and 10 Mohm/sq. It is specifically designed to enable the measurement of thin films in the nanometer range.

Tool name:
Four Point Probe
Area/room:
3R86 - röntgeninsp / luminiscens
Category:
Metrology
Manufacturer:
Ossila
Model:
T2001A3
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hours
Max booking time, night:
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